EMI Filter design part II: Measurement of noise source impedances

Abstract

In the first part of the EMI filter design series, the conducted EMI generation mechanism was explained. In this second part, a method on the measurement of noise source impedance of SMPS will be described. The proposed measurement method allows accurate extraction of the common-mode and differentialmode equivalent noise source impedances of a SMPS under it actual operating conditions. © 2012 IEEE Electromagnetic Compatibility.